Technical information
TEM JEOL 2010, working at 200 kV, point resolution of 1.9 Å, UHR pole pieces, LaB6 gun; the microscope is equipped with an energy dispersive spectrometer (EDS) Oxford ISIS and with a semiSTEM system. TEM images and electron diffraction patters can be recorded on photographic films, imaging plates, and files.
Main research topics
- Mineral defects and mineral reactions at the nanoscale
- Mineralogy and nanostructures in fault rocks
- Clay minerals
- Serpentine minerals
- Airborne particulate
- Nanomaterials
Lead scientist
Researcher
Technician
- Magrini Claudia
Research topics