Martedì, 7 Marzo 2023
Electron Microscopy Facility - Staff Member High-end EM
Electron Microscopy Facility - Staff Member High-end EM (1.0 FTE)
Utrecht University
Utrecht, Netherlands
Automation of the characterization of crystalline defects using Scanning Electron Microscopy (SEM): application for the GaN industry.
Automation of the characterization of crystalline defects using Scanning Electron Microscopy (SEM): application for the GaN industry.
Laboratoire d'étude des microstructures et de mécanique des matériaux
Metz, France